Authors:
Cremona, M
Mauricio, MHP
Do Carmo, LCS
Prioli, R
Nunes, VB
Zanette, SI
Caride, AO
Albuquerque, MP
Citation: M. Cremona et al., Grain size distribution analysis in polycrystalline LiF thin films by mathematical morphology techniques on AFM images and X-ray diffraction data, J MICROSC O, 197, 2000, pp. 260-267
Authors:
Cremona, M
Pereira, JAM
Mauricio, MHP
Do Carmo, LCS
Somma, F
Citation: M. Cremona et al., Sputtering and coloration process in LiF thin layers induced by MeV ion bombardment, RADIAT EFF, 149(1-4), 1999, pp. 215-219
Authors:
Cremona, M
Mauricio, MHP
Fehlberg, LV
Nunes, RA
do Carmo, LCS
de Avillez, RR
Caride, AO
Citation: M. Cremona et al., Grazing incidence X-ray diffraction analysis of alkali fluoride thin filmsfor optical devices, THIN SOL FI, 333(1-2), 1998, pp. 157-164