Authors:
Maus-Friedrichs, W
Gunhold, A
Frerichs, M
Kempter, V
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Citation: Hs. Guo et al., The relation between preexisting defects and charging-up in 9mol%Y2O3-ZrO2studied by Auger electron speclroscopy, CHIN PHYS, 9(3), 2000, pp. 225-232
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