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Results: 1-11 |
Results: 11
A high-throughput x-ray microtomography system at the Advanced Photon Source
Authors: Wang, YX De Carlo, F Mancini, DC McNulty, I Tieman, B Bresnahan, J Foster, I Insley, J Lane, P von Laszewski, G Kesselman, C Su, MH Thiebaux, M
Citation: Yx. Wang et al., A high-throughput x-ray microtomography system at the Advanced Photon Source, REV SCI INS, 72(4), 2001, pp. 2062-2068
X-ray speckle contrast variation across absorption edges - art. no. 077401
Authors: Retsch, CC McNulty, I
Citation: Cc. Retsch et I. Mcnulty, X-ray speckle contrast variation across absorption edges - art. no. 077401, PHYS REV L, 8707(7), 2001, pp. 7401
Spatial coherence measurement of X-ray undulator radiation
Authors: Paterson, D Allman, BE McMahon, PJ Lin, J Moldovan, N Nugent, KA McNulty, I Chantler, CT Retsch, CC Irving, THK Mancini, DC
Citation: D. Paterson et al., Spatial coherence measurement of X-ray undulator radiation, OPT COMMUN, 195(1-4), 2001, pp. 79-84
Accurate pattern registration for integrated circuit tomography
Authors: Levine, ZH Grantham, S Neogi, S Frigo, SP McNulty, I Retsch, CC Wang, YX Lucatorto, TB
Citation: Zh. Levine et al., Accurate pattern registration for integrated circuit tomography, J APPL PHYS, 90(2), 2001, pp. 556-560
Noninterferometric quantitative phase imaging with soft x rays
Authors: Allman, BE McMahon, PJ Tiller, JB Nugent, KA Paganin, D Barty, A McNulty, I Frigo, SP Wang, YX Retsch, CC
Citation: Be. Allman et al., Noninterferometric quantitative phase imaging with soft x rays, J OPT SOC A, 17(10), 2000, pp. 1732-1743
Illumination for coherent soft X-ray applications: the new X1A beamline atthe NSLS
Authors: Winn, B Ade, H Buckley, C Feser, M Howells, M Hulbert, S Jacobsen, C Kaznacheyev, K Kirz, J Osanna, A Maser, J McNulty, I Miao, J Oversluizen, T Spector, S Sullivan, B Wang, Y Wirick, S Zhang, H
Citation: B. Winn et al., Illumination for coherent soft X-ray applications: the new X1A beamline atthe NSLS, J SYNCHROTR, 7, 2000, pp. 395-404
Tomography of integrated circuit interconnect with an electromigration void
Authors: Levine, ZH Kalukin, AR Kuhn, M Frigo, SP McNulty, I Retsch, CC Wang, YX Arp, U Lucatorto, TB Ravel, BD Tarrio, C
Citation: Zh. Levine et al., Tomography of integrated circuit interconnect with an electromigration void, J APPL PHYS, 87(9), 2000, pp. 4483-4488
Quantitative nanoscale metrology study of Cu/SiO2 interconnect technology using transmission x-ray microscopy
Authors: Su, X Stagarescu, C Xu, G Eastman, DE McNulty, I Frigo, SP Wang, YX Retsch, CC Noyan, IC Hu, CK
Citation: X. Su et al., Quantitative nanoscale metrology study of Cu/SiO2 interconnect technology using transmission x-ray microscopy, APPL PHYS L, 77(21), 2000, pp. 3465-3467
A classical Hanbury Brown-Twiss experiment with hard X-rays
Authors: Gluskin, E Alp, EE McNulty, I Sturhahn, W Sutter, J
Citation: E. Gluskin et al., A classical Hanbury Brown-Twiss experiment with hard X-rays, J SYNCHROTR, 6, 1999, pp. 1065-1066
Tomographic reconstruction of an integrated circuit interconnect
Authors: Levine, ZH Kalukin, AR Frigo, SP McNulty, I Kuhn, M
Citation: Zh. Levine et al., Tomographic reconstruction of an integrated circuit interconnect, APPL PHYS L, 74(1), 1999, pp. 150-152
Coherent X-ray study of fluctuations during domain coarsening
Authors: Malik, A Sandy, AR Lurio, LB Stephenson, GB Mochrie, SGJ McNulty, I Sutton, M
Citation: A. Malik et al., Coherent X-ray study of fluctuations during domain coarsening, PHYS REV L, 81(26), 1998, pp. 5832-5835
Risultati: 1-11 |