Authors:
Meduna, M
Holy, V
Roch, T
Stangl, J
Bauer, G
Zhu, J
Brunner, K
Abstreiter, G
Citation: M. Meduna et al., X-ray reflectivity of self-assembled structures in SiGe multilayers and comparison with atomic force microscopy, J APPL PHYS, 89(9), 2001, pp. 4836-4842