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Results:
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Results: 1
Dielectric characterization of ferroelectric thin films deposited on silicon
Authors:
Legrand, C Haccart, T Velu, G Chambonnet, D Remiens, D Burgnies, L Mehri, F Carru, JC
Citation:
C. Legrand et al., Dielectric characterization of ferroelectric thin films deposited on silicon, MICROEL REL, 39(2), 1999, pp. 251-256
Risultati:
1-1
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