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Results:
1-1
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Results: 1
Authors:
Herms, M
Fukuzawa, M
Melov, VG
Schreiber, J
Mock, P
Yamada, M
Citation: M. Herms et al., Residual strain in annealed GaAs single-crystal wafers as determined by scanning infrared polariscopy, X-ray diffraction and topography, J CRYST GR, 210(1-3), 2000, pp. 172-176
Risultati:
1-1
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