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Results:
1-7
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Results: 7
Authors:
Mann, SE
Miaoulis, IN
Wong, PY
Citation: Se. Mann et al., Spectral imaging, reflectivity measurements, and modeling of iridescent butterfly scale structures, OPT ENG, 40(10), 2001, pp. 2061-2068
Authors:
Tada, H
Abramson, AR
Mann, SE
Miaoulis, IN
Wong, PY
Citation: H. Tada et al., Evaluating the effects of thin film patterns on the temperature distribution of silicon wafers during radiant processing, OPT ENG, 39(8), 2000, pp. 2296-2304
Authors:
Tada, H
Kumpel, AE
Lathrop, RE
Slanina, JB
Nieva, P
Zavracky, P
Miaoulis, IN
Wong, PY
Citation: H. Tada et al., Novel imaging system for measuring microscale curvatures at high temperatures, REV SCI INS, 71(1), 2000, pp. 161-167
Authors:
Tada, H
Kumpel, AE
Lathrop, RE
Slanina, JB
Nieva, P
Zavracky, P
Miaoulis, IN
Wong, PY
Citation: H. Tada et al., Thermal expansion coefficient of polycrystalline silicon and silicon dioxide thin films at high temperatures, J APPL PHYS, 87(9), 2000, pp. 4189-4193
Authors:
Bluestein, SD
Chan, EK
Miaoulis, IN
Wong, PY
Citation: Sd. Bluestein et al., In situ measurement of thermomechanical effects and properties in thin-film polymers, IEEE T COMP, 22(3), 1999, pp. 421-425
Authors:
Tada, H
Mann, SE
Miaoulis, IN
Wong, PY
Citation: H. Tada et al., Effects of a butterfly scale microstructure on the iridescent color observed at different angles, OPT EXPRESS, 5(4), 1999, pp. 87-92
Authors:
Abramson, AR
Nieva, P
Tada, H
Zavracky, P
Miaoulis, IN
Wong, PY
Citation: Ar. Abramson et al., Effect of doping level during rapid thermal processing of multilayer structures, J MATER RES, 14(6), 1999, pp. 2402-2410
Risultati:
1-7
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