Authors: Mikolajick, T Dehm, C Hartner, W Kasko, I Kastner, MJ Nagel, N Moert, M Mazure, C

Citation: T. Mikolajick et al., FeRAM technology for high density applications, MICROEL REL, 41(7), 2001, pp. 947-950

Authors: Hartner, W Schindler, G Bosk, P Gabric, Z Kastner, M Beitel, G Mikolajick, T Dehm, C Mazure, C

Citation: W. Hartner et al., Integration of H-2 barriers for ferroelectric memories based on SrBi2Ta2O9(SBT), INTEGR FERR, 31(1-4), 2000, pp. 273-284

Authors: Mort, M Schindler, G Hartner, W Kasko, I Kastner, MJ Mikolajick, T Dehm, C Waser, R

Citation: M. Mort et al., Low temperature process and thin SBT films for ferroelectric memory devices, INTEGR FERR, 30(1-4), 2000, pp. 235-244

Authors: Boubekeur, H Hopfner, J Mikolajick, T Dehm, C Frey, L Ryssel, H

Citation: H. Boubekeur et al., Aspects of barium contamination in high dielectric dynamic random access memories, J ELCHEM SO, 147(11), 2000, pp. 4297-4300

Authors: Mikolajick, T Kuhnhold, R Schnupp, R Ryssel, H

Citation: T. Mikolajick et al., The influence of surface oxidation on the pH-sensing properties of siliconnitride, SENS ACTU-B, 58(1-3), 1999, pp. 450-455