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Results: 1
Chemical depth profiling on submicron regions: a combined focused ion beamscanning electron microscope approach
Authors:
Chan, DK Misquitta, SF Ying, JF Martner, CC Hermsmeier, BD
Citation:
Dk. Chan et al., Chemical depth profiling on submicron regions: a combined focused ion beamscanning electron microscope approach, SURF INT AN, 27(4), 1999, pp. 199-203
Risultati:
1-1
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