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Citation: Ml. O'Malley et al., Electrical simulation of scanning capacitance microscopy imaging of the pnjunction with semiconductor probe tips, APPL PHYS L, 74(24), 1999, pp. 3672-3674

Authors: O'Malley, ML Timp, GL Moccio, SV Garno, JP Kleiman, RN

Citation: Ml. O'Malley et al., Quantification of scanning capacitance microscopy imaging of the pn junction through electrical simulation, APPL PHYS L, 74(2), 1999, pp. 272-274