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Results:
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Results: 2
Degradation mechanisms in SOI n-channel LDMOSFETs
Authors:
Vandooren, A Conley, JF Cristoloveanu, S Mojarradi, M Kolawa, E
Citation:
A. Vandooren et al., Degradation mechanisms in SOI n-channel LDMOSFETs, MICROEL ENG, 59(1-4), 2001, pp. 489-495
Back-gate and series resistance effects in LDMOSFETs on SOI
Authors:
Vandooren, A Cristoloveanu, S Mojarradi, M Kolawa, E
Citation:
A. Vandooren et al., Back-gate and series resistance effects in LDMOSFETs on SOI, IEEE DEVICE, 48(10), 2001, pp. 2410-2416
Risultati:
1-2
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