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Results: 1-11 |
Results: 11
Effect of regenerative load on a Static Transfer Switch performance
Authors: Mokhtari, H Dewan, SB Iravani, MR
Citation: H. Mokhtari et al., Effect of regenerative load on a Static Transfer Switch performance, IEEE POW D, 16(4), 2001, pp. 619-624
Benchmark systems for digital computer simulation of a Static Transfer Switch
Authors: Iravani, MR Sen, K Gole, A Irwin, G Johnson, B Keri, A Lehn, P Mahseredjin, J Martinez, JA Mokhtari, H Sedighy, M Woodford, DA Dewan, SB
Citation: Mr. Iravani et al., Benchmark systems for digital computer simulation of a Static Transfer Switch, IEEE POW D, 16(4), 2001, pp. 724-731
Closure to discussion of "Performance evaluation of thyristor based statictransfer switch"
Authors: Mokhtari, H Dewan, SB Iravani, MR
Citation: H. Mokhtari et al., Closure to discussion of "Performance evaluation of thyristor based statictransfer switch", IEEE POW D, 16(4), 2001, pp. 820-821
Profiling band structure in GaN devices by electron holography
Authors: Cherns, D Mokhtari, H Jiao, CG Averbeck, R Riechert, H
Citation: D. Cherns et al., Profiling band structure in GaN devices by electron holography, J CRYST GR, 230(3-4), 2001, pp. 410-414
Amorphous GaN grown by room temperature molecular beam epitaxy
Authors: Kuball, M Mokhtari, H Cherns, D Lu, J Westwood, DI
Citation: M. Kuball et al., Amorphous GaN grown by room temperature molecular beam epitaxy, JPN J A P 1, 39(8), 2000, pp. 4753-4754
Wavelet based on-line disturbance detection for power quality applications
Authors: Karimi, M Mokhtari, H Iravani, MR
Citation: M. Karimi et al., Wavelet based on-line disturbance detection for power quality applications, IEEE POW D, 15(4), 2000, pp. 1212-1220
Performance evaluation of thyristor based static transfer switch
Authors: Mokhtari, H Dewan, SB Iravani, MR
Citation: H. Mokhtari et al., Performance evaluation of thyristor based static transfer switch, IEEE POW D, 15(3), 2000, pp. 960-966
Characterisation of defects and piezoelectric fields in InGaN/GaN layers by transmission electron microscopy
Authors: Cherns, D Barnard, J Mokhtari, H
Citation: D. Cherns et al., Characterisation of defects and piezoelectric fields in InGaN/GaN layers by transmission electron microscopy, MAT SCI E B, 66(1-3), 1999, pp. 33-38
The natural course of an ossifying fibroma - A case report
Authors: Rosenberg, A Mokhtari, H Slootweg, PJ
Citation: A. Rosenberg et al., The natural course of an ossifying fibroma - A case report, INT J OR M, 28(6), 1999, pp. 454-456
A comprehensive double knife-edge diffraction computation method based on the complete Fresnel theory and a recursive series expansion method
Authors: Mokhtari, H
Citation: H. Mokhtari, A comprehensive double knife-edge diffraction computation method based on the complete Fresnel theory and a recursive series expansion method, IEEE VEH T, 48(2), 1999, pp. 589-592
Comparative study of lateral profile knife-edge diffraction and ray tracing technique using GTD in urban environment
Authors: Mokhtari, H Lazaridis, P
Citation: H. Mokhtari et P. Lazaridis, Comparative study of lateral profile knife-edge diffraction and ray tracing technique using GTD in urban environment, IEEE VEH T, 48(1), 1999, pp. 255-261
Risultati: 1-11 |