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Results: 1-12 |
Results: 12

Authors: Benko, E Barr, TL Hardcastle, S Hoppe, E Bernasik, A Morgiel, J
Citation: E. Benko et al., XPS study of the cBN-TiC system, CERAM INT, 27(6), 2001, pp. 637-643

Authors: Jaworska, L Szutkowska, M Morgiel, J Stobierski, L Lis, J
Citation: L. Jaworska et al., Ti3SiC2 as a bonding phase in diamond composites, J MAT SCI L, 20(19), 2001, pp. 1783-1786

Authors: Kale, A Seal, S Sobczak, N Morgiel, J Sundaram, KB
Citation: A. Kale et al., Effect of deposition temperature on the morphology, structure, surface chemistry and mechanical properties of magnetron sputtered Ti70-A130 thin films on steel substrate, SURF COAT, 141(2-3), 2001, pp. 252-261

Authors: Riesenkampf, W Biestek, T Morgiel, J Lasocha, W
Citation: W. Riesenkampf et al., New high-tin phase found in electrolytic Sn-Ni deposits, J MATER SCI, 36(19), 2001, pp. 4633-4636

Authors: Jaworska, L Gibas, T Krolicka, B Morgiel, J Skrzypek, SJ
Citation: L. Jaworska et al., Reactions and stresses in polycrystalline diamond-metal and diamond-carbide compacts, HIGH PR RES, 18(1-6), 2000, pp. 271-277

Authors: Dutkiewicz, J Czeppe, T Morgiel, J Maziarz, W
Citation: J. Dutkiewicz et al., Properties and structure of the shape-memory melt spun CuAlNiMnTi(Zr) ribbons, ARCH METALL, 45(3), 2000, pp. 247-260

Authors: Seal, S Warwick, T Sobczak, N Morgiel, J
Citation: S. Seal et al., A scanning photoemission microscope (SPEM) to study the interface chemistry of AlTi/C system, J MAT SCI L, 19(2), 2000, pp. 123-126

Authors: Labar, JL Morgiel, J Toth, L Dodony, I
Citation: Jl. Labar et al., Sites are separable in garnets with ALCHEMI, MIKROCH ACT, 132(2-4), 2000, pp. 489-492

Authors: Dutkiewicz, J Czeppe, T Morgiel, J
Citation: J. Dutkiewicz et al., Effect of titanium on structure and martensic transformation in rapidly solidified Cu-Al-Ni-Mn-Ti alloys, MAT SCI E A, 275, 1999, pp. 703-707

Authors: Seal, S Bracho, L Shukla, S Morgiel, J
Citation: S. Seal et al., Processing and characterization of nanometer sized copper sulfide particles, J VAC SCI A, 17(5), 1999, pp. 2950-2956

Authors: Nowak, R Yoshida, F Morgiel, J Major, B
Citation: R. Nowak et al., Postdeposition relaxation of internal stress in sputter-grown thin films caused by ion bombardment, J APPL PHYS, 85(2), 1999, pp. 841-852

Authors: Labar, JL Morgiel, J
Citation: Jl. Labar et J. Morgiel, A new method for the measurement of thickness in single crystals, MICRON, 29(6), 1998, pp. 425-430
Risultati: 1-12 |