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Results: 1
New self-dual circuits for error detection and testing
Authors:
Dmitriev, A Saposhnikov, V Saposhnikov, V Goessel, M Moshanin, V Morosov, A
Citation:
A. Dmitriev et al., New self-dual circuits for error detection and testing, VLSI DESIGN, 11(1), 2000, pp. 1-21
Risultati:
1-1
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