Authors: Popov, VP Antonova, IV Gutakovsky, AK Spesivtsev, EV Morosov, II

Citation: Vp. Popov et al., Ellipsometry and microscopy study of nanocrystalline Si : H layers formed by high dose implantation of silicon, MAT SCI E B, 73(1-3), 2000, pp. 120-123