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Results:
1-2
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Results: 2
New self-dual circuits for error detection and testing
Authors:
Dmitriev, A Saposhnikov, V Saposhnikov, V Goessel, M Moshanin, V Morosov, A
Citation:
A. Dmitriev et al., New self-dual circuits for error detection and testing, VLSI DESIGN, 11(1), 2000, pp. 1-21
Experimental results for self-dual multi-output combinational circuits
Authors:
Saposhnikov, VV Moshanin, V Saposhnikov, VV Goessel, M
Citation:
Vv. Saposhnikov et al., Experimental results for self-dual multi-output combinational circuits, J ELEC TEST, 14(3), 1999, pp. 295-300
Risultati:
1-2
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