Authors: Dmitriev, A Saposhnikov, V Saposhnikov, V Goessel, M Moshanin, V Morosov, A

Citation: A. Dmitriev et al., New self-dual circuits for error detection and testing, VLSI DESIGN, 11(1), 2000, pp. 1-21

Authors: Saposhnikov, VV Moshanin, V Saposhnikov, VV Goessel, M

Citation: Vv. Saposhnikov et al., Experimental results for self-dual multi-output combinational circuits, J ELEC TEST, 14(3), 1999, pp. 295-300