Authors: Mourier, Y G-Jarrix, S Delseny, C Pascal, F Penarier, A Gasquet, D

Citation: Y. Mourier et al., Characterization of polysilicon bipolar transistors by low-frequency noiseand correlation noise measurements, SEMIC SCI T, 16(4), 2001, pp. 233-238

Authors: Llinares, P Ghibaudo, G Mourier, Y Gambetta, N Laurens, F Chroboczek, JA

Citation: P. Llinares et al., Determination of base and emitter resistances in bipolar junction transistors from low frequency noise and static measurements, IEICE TR EL, E82C(4), 1999, pp. 607-611