Authors: Lian, FL Moyne, JR Tilbury, DM

Citation: Fl. Lian et al., Performance evaluation of control networks: Ethernet, ControlNet, and DeviceNet, IEEE CONT S, 21(1), 2001, pp. 66-83

Authors: Ning, Z Moyne, JR Smith, TH Boning, DS Del Castillo, E Yeh, JY Hurwitz, AM

Citation: Z. Ning et al., A comparative analysis of run-to-run control algorithms in the semiconductor manufacturing industry, RUN-TO-RUN CONTROL IN SEMICONDUCTOR MANUFACTURING, 2001, pp. 101-111