Authors:
Krauss, AR
Auciello, O
Dhote, AM
Im, J
Aggarwal, S
Ramesh, R
Irene, EA
Gao, Y
Mueller, AH
Citation: Ar. Krauss et al., Studies of ferroelectric film growth and capacitor interface processes viain situ analytical techniques and correlation with electrical properties, INTEGR FERR, 32(1-4), 2001, pp. 813-823
Citation: S. Munier et al., Impact parameter dependent S-matrix for dipole-proton scattering from diffractive meson electroproduction, NUCL PHYS B, 603(1-2), 2001, pp. 427-445
Citation: Ah. Mueller et Dn. Triantafyllopoulos, On the relationship between large order graphs and instantons for the double well oscillator, NUCL PHYS B, 595(3), 2001, pp. 567-586
Authors:
Auciello, O
Krauss, AR
Im, J
Dhote, A
Gruen, DM
Irene, EA
Gao, Y
Mueller, AH
Ramesh, R
Citation: O. Auciello et al., Studies of ferroelectric heterostructure thin films and interfaces, via insitu analytical techniques, INTEGR FERR, 29(1-2), 2000, pp. 1-12
Authors:
Auciello, O
Krauss, AR
Im, J
Dhote, A
Gruen, DM
Aggarwal, S
Ramesh, R
Irene, EA
Gao, Y
Mueller, AH
Citation: O. Auciello et al., Studies of ferroelectric heterostructure thin films, interfaces, and device-related processes via in situ analytical techniques, INTEGR FERR, 27(1-4), 1999, pp. 1147-1162
Authors:
Gao, Y
Mueller, AH
Irene, EA
Auciello, O
Krauss, A
Schultz, JA
Citation: Y. Gao et al., In situ study of interface reactions of ion beam sputter deposited (Ba0.5Sr0.5)TiO3 films on Si, SiO2, and Ir, J VAC SCI A, 17(4), 1999, pp. 1880-1886
Authors:
Baier, R
Dokshitzer, YL
Mueller, AH
Schiff, D
Citation: R. Baier et al., Angular dependence of the radiative gluon spectrum and the energy loss of hard jets in QCD media - art. no. 064902, PHYS REV C, 6006(6), 1999, pp. 4902
Authors:
Gao, Y
Mueller, AH
Irene, EA
Auciello, O
Krauss, AR
Schultz, JA
Citation: Y. Gao et al., Real-time study of oxygen in c-axis oriented YBa2Cu3O7-delta thin films using in situ spectroscopic ellipsometry, J APPL PHYS, 86(12), 1999, pp. 6979-6984