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Results: 1-10 |
Results: 10

Authors: Chen, SH Schumacher, G Mukherji, D Frohberg, G Wahi, RP
Citation: Sh. Chen et al., The effect of local composition on defect structure in a near-gamma-TiAl alloy with duplex microstructure, PHIL MAG A, 81(11), 2001, pp. 2653-2664

Authors: Chen, SH Mukherji, D Schumacher, G Frohberg, G Wahi, RP
Citation: Sh. Chen et al., Microstructural characterisation of defect structures in a TiAl-base Ti-47Al-2Nb-2Mn(at.%)+0.8vol.%TiB2 alloy, MAT SCI E A, 300(1-2), 2001, pp. 299-308

Authors: Siemers, C Mukherji, D Baker, M Rosler, J
Citation: C. Siemers et al., Deformation and microstructure of titanium chips and workpiece, Z METALLKUN, 92(8), 2001, pp. 853-859

Authors: Siemers, C Mukherji, D Grusewski, C Baker, M Rosler, J
Citation: C. Siemers et al., Cross-sectional TEM sample preparation for the analysis of chips of Ti6Al4V - Preparation method and a few results, PRAKT METAL, 38(10), 2001, pp. 591-603

Authors: Strunz, P Mukherji, D Gilles, R Wiedenmann, A Rosler, J Fuess, H
Citation: P. Strunz et al., Determination of gamma ' solution temperature in Re-rich Ni-base superalloy by small-angle neutron scattering (vol 34, pg 541, 2001), J APPL CRYS, 34, 2001, pp. 787-787

Authors: Strunz, P Mukherji, D Gilles, R Wiedenmann, A Fuess, H
Citation: P. Strunz et al., Determination of gamma ' solution temperature in Re-rich Ni-base superalloy by small-angle neutron scattering, J APPL CRYS, 34, 2001, pp. 541-548

Authors: Gabrisch, H Mukherji, D
Citation: H. Gabrisch et D. Mukherji, Character of dislocations at the gamma/gamma ' interfaces and internal stresses in nickel-base superalloys, ACT MATER, 48(12), 2000, pp. 3157-3167

Authors: Chen, SH Mukherji, D Schumacher, G Frohberg, G Wahi, RP
Citation: Sh. Chen et al., Observation of planar stacking faults in a Ti-rich two-phase Ti-Al alloy after deformation at elevated temperatures, PHIL MAG L, 80(1), 2000, pp. 19-26

Authors: Strunz, P Wiedenmann, A Gilles, R Mukherji, D Zrnik, J Schumacher, G
Citation: P. Strunz et al., Evaluation procedure for anisotropic SANS, J APPL CRYS, 33(1), 2000, pp. 834-838

Authors: Mukherji, D Gilles, R Strunz, P Lieske, S Wiedenmann, A Wahi, RP
Citation: D. Mukherji et al., Measurement of gamma ' precipitate morphology by small angle neutron scattering, SCR MATER, 41(1), 1999, pp. 31-38
Risultati: 1-10 |