Authors:
Kozharinov, VV
Sushentsov, VN
Mukhurov, NI
Mardilovich, PP
Citation: Vv. Kozharinov et al., Nondestructive tests of dielectric coating thickness and quality based on frequency characteristics of electric discharge, RUSS J NOND, 36(9), 2000, pp. 681-684
Authors:
Mukhurov, NI
Trofimov, YV
Sivenkov, VK
Posed'ko, AS
Survilo, LN
Kotova, IF
Malevich, NR
Citation: Ni. Mukhurov et al., An apparatus for studying the heat characteristics of thin-film photoconductive cells, INSTR EXP R, 42(3), 1999, pp. 432-435