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Citation: Bp. Coonan et al., Investigation of Si/SiGe heterostructure material using non-destructive optical techniques, THIN SOL FI, 364(1-2), 2000, pp. 75-79

Authors: Moriarty, GR Kildemo, M Beechinor, JT Murtagh, M Kelly, PV Crean, GM Bland, SW

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Authors: Murtagh, M Beechinor, JT Cordero, N Kelly, PV Crean, GM Bland, SW

Citation: M. Murtagh et al., InGaP/GaAs based heterojunction bipolar transistor characterisation using non-contact optical spectroscopy, MAT SCI E B, 66(1-3), 1999, pp. 185-188