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LIFETIME PREDICTION FOR PMOS, AND NMOS DEVICES BASED ON A DEGRADATIONMODEL FOR GATE-BIAS-STRESS
Authors:
NARR A LILL A
Citation:
A. Narr et A. Lill, LIFETIME PREDICTION FOR PMOS, AND NMOS DEVICES BASED ON A DEGRADATIONMODEL FOR GATE-BIAS-STRESS, Microelectronics and reliability, 37(10-11), 1997, pp. 1433-1436
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