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Citation: Mg. Pecht et Fr. Nash, PREDICTING THE RELIABILITY OF ELECTRONIC EQUIPMENT, Proceedings of the IEEE, 82(7), 1994, pp. 992-1004

Authors: TWU Y CHENG LS CHU SNG NASH FR WANG KW PARAYANTHAL P

Citation: Y. Twu et al., SEMICONDUCTOR-LASER DAMAGE DUE TO HUMAN-BODY-MODEL ELECTROSTATIC DISCHARGE, Journal of applied physics, 74(3), 1993, pp. 1510-1520