Authors: NASSIM K JOANNES L CORNET A DILHAIRE S SCHAUB E CLAEYS W

Citation: K. Nassim et al., THERMOMECHANICAL DEFORMATION IMAGING OF POWER DEVICES BY ELECTRONIC SPECKLE PATTERN INTERFEROMETRY (ESPI), Microelectronics and reliability, 38(6-8), 1998, pp. 1341-1345