Authors: NEERINCK DG DEVEIRMAN AEM SLANGEN MHJ RIJKS TGSM KOOLS JCS

Citation: Dg. Neerinck et al., GRAIN-SIZE AND STRAIN IN THIN SPUTTER-DEPOSITED NI0.8FE0.2 AND CU FILMS, Thin solid films, 280(1-2), 1996, pp. 136-141

Authors: NEERINCK DG VINK TJ

Citation: Dg. Neerinck et Tj. Vink, DEPTH PROFILING OF THIN ITO FILMS BY GRAZING-INCIDENCE X-RAY-DIFFRACTION, Thin solid films, 278(1-2), 1996, pp. 12-17

Authors: DEKEIJSER M DELEEUW DM VANVELDHOVEN PJ DEVEIRMAN AEM NEERINCK DG DORMANS GJM

Citation: M. Dekeijser et al., THE STRUCTURE OF HETEROEPITAXIAL LEAD TITANATE LAYERS GROWN BY ORGANOMETALLIC CHEMICAL-VAPOR-DEPOSITION, Thin solid films, 266(2), 1995, pp. 157-167

Authors: NEERINCK DG WOLF RM AANDESTEGGE JBF

Citation: Dg. Neerinck et al., DISCRETE THICKNESS FLUCTUATIONS IN FE3O4 COO MULTILAYERS/, Journal of applied crystallography, 28, 1995, pp. 335-337

Authors: RIJKS TGSM SOUR RLH NEERINCK DG DEVEIRMAN AEM COEHOORN R KOOLS JCS GILLIES MF DEJONGE WJM

Citation: Tgsm. Rijks et al., INFLUENCE OF GRAIN-SIZE ON THE TRANSPORT-PROPERTIES OF NI80FE20 AND CU THIN-FILMS, IEEE transactions on magnetics, 31(6), 1995, pp. 3865-3867