Authors: NIKOLAIDIS T RICHIER C REFFAY M MORTINI P PANANAKAKIS G

Citation: T. Nikolaidis et al., INFLUENCE OF PARASITIC STRUCTURES ON THE ESD PERFORMANCE OF A PURE BIPOLAR PROCESS, Microelectronics and reliability, 36(11-12), 1996, pp. 1723-1726

Authors: NIKOLAIDIS T

Citation: T. Nikolaidis, ESD PERFORMANCE EVALUATION OF FIELD OXIDE LATERAL NPN TRANSISTORS, Electronics Letters, 32(8), 1996, pp. 769-770