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Results: 1-13 |
Results: 13
AN HSF-SIMS INVESTIGATION OF THE PREPHOSPHATATION CONTRIBUTION TO THEPHOSPHATATION PROCESS OF SILICON STEEL SURFACE
Authors: ALLALI H BENEMBAREK M DEBRE O NSOULI B OLADIPO A ROCHE A THOMAS JP
Citation: H. Allali et al., AN HSF-SIMS INVESTIGATION OF THE PREPHOSPHATATION CONTRIBUTION TO THEPHOSPHATATION PROCESS OF SILICON STEEL SURFACE, Rapid communications in mass spectrometry, 11(13), 1997, pp. 1377-1382
GAMMA-IRRADIATION-INDUCED MODIFICATIONS OF POLYMERS FOUND IN NUCLEAR WASTE EMBEDDING PROCESSES .1. THE EPOXY AMINE RESIN/
Authors: DEBRE O NSOULI B THOMAS JP STEVENSON I COLOMBINI D ROMERO MA
Citation: O. Debre et al., GAMMA-IRRADIATION-INDUCED MODIFICATIONS OF POLYMERS FOUND IN NUCLEAR WASTE EMBEDDING PROCESSES .1. THE EPOXY AMINE RESIN/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 131(1-4), 1997, pp. 313-320
GAMMA-IRRADIATION-INDUCED MODIFICATIONS OF POLYMERS FOUND IN NUCLEAR WASTE EMBEDDING PROCESSES .2. THE ION-EXCHANGE RESIN
Authors: DEBRE O NSOULI B THOMAS JP STEVENSON I COLOMBINI D ROMERO MA
Citation: O. Debre et al., GAMMA-IRRADIATION-INDUCED MODIFICATIONS OF POLYMERS FOUND IN NUCLEAR WASTE EMBEDDING PROCESSES .2. THE ION-EXCHANGE RESIN, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 131(1-4), 1997, pp. 321-328
MEV ION SPUTTERING OF POLYMERS - OBSERVATION OF A SECONDARY-ION EMISSION DEPENDENCE ON THE CRYSTALLINITY OF PEEK AND PET FILMS
Authors: NSOULI B DOLE P ALLALI H DEBRE O COLOMBINI D THOMAS JP
Citation: B. Nsouli et al., MEV ION SPUTTERING OF POLYMERS - OBSERVATION OF A SECONDARY-ION EMISSION DEPENDENCE ON THE CRYSTALLINITY OF PEEK AND PET FILMS, International journal of mass spectrometry and ion processes, 164(3), 1997, pp. 7-15
GAMMA-RAY-INDUCED MODIFICATIONS OF THE CHEMICAL-STRUCTURE OF AN ION-EXCHANGE RESIN
Authors: DRAYE M NSOULI B ALLALI H LEMAIRE M THOMAS JP
Citation: M. Draye et al., GAMMA-RAY-INDUCED MODIFICATIONS OF THE CHEMICAL-STRUCTURE OF AN ION-EXCHANGE RESIN, Polymer degradation and stability, 56(2), 1997, pp. 157-167
THERMOOXIDATION-INDUCED SURFACE MODIFICATIONS OF THE ETHYLENE-METHYL ACRYLATE COPOLYMER AS INVESTIGATED BY TIME-OF-FLIGHT PARTICLE-INDUCED DESORPTION MASS-SPECTROMETRY .1. INDIVIDUAL HOMOPOLYMERS
Authors: NSOULI B DOLE P ALLALI H CHAUCHARD J THOMAS JP
Citation: B. Nsouli et al., THERMOOXIDATION-INDUCED SURFACE MODIFICATIONS OF THE ETHYLENE-METHYL ACRYLATE COPOLYMER AS INVESTIGATED BY TIME-OF-FLIGHT PARTICLE-INDUCED DESORPTION MASS-SPECTROMETRY .1. INDIVIDUAL HOMOPOLYMERS, Rapid communications in mass spectrometry, 10(2), 1996, pp. 157-161
THERMOOXIDATION-INDUCED SURFACE MODIFICATIONS OF THE ETHYLENE-METHYL ACRYLATE COPOLYMER AS INVESTIGATED BY TIME-OF-FLIGHT PARTICLE-INDUCED DESORPTION MASS-SPECTROMETRY .2. THE COPOLYMER
Authors: NSOULI B DOLE P ALLALI H CHAUCHARD J THOMAS JP
Citation: B. Nsouli et al., THERMOOXIDATION-INDUCED SURFACE MODIFICATIONS OF THE ETHYLENE-METHYL ACRYLATE COPOLYMER AS INVESTIGATED BY TIME-OF-FLIGHT PARTICLE-INDUCED DESORPTION MASS-SPECTROMETRY .2. THE COPOLYMER, Rapid communications in mass spectrometry, 10(2), 1996, pp. 162-166
SPONTANEOUS DESORPTION - A CONTROLLED PHENOMENON FOR SURFACE-ANALYSISAPPLICATION .1. NEW EVIDENCE FOR A SPUTTERING PROCESS-INDUCED BY A WELL LOCALIZED FIELD ENHANCED DESORPTION
Authors: ALLALI H DEBRE O LAGRANGE B NSOULI B OLADIPO AA THOMAS JP
Citation: H. Allali et al., SPONTANEOUS DESORPTION - A CONTROLLED PHENOMENON FOR SURFACE-ANALYSISAPPLICATION .1. NEW EVIDENCE FOR A SPUTTERING PROCESS-INDUCED BY A WELL LOCALIZED FIELD ENHANCED DESORPTION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 108(1-2), 1996, pp. 163-172
ENERGY DEPOSITION AND FRAGMENTS PRODUCTION RESULTING FROM GAMMA-RAY OR ION-BEAM IRRADIATION OF AN ION-EXCHANGE RESIN
Authors: NSOULI B DRAYE M ALLALI H LEMAIRE M THOMAS JP
Citation: B. Nsouli et al., ENERGY DEPOSITION AND FRAGMENTS PRODUCTION RESULTING FROM GAMMA-RAY OR ION-BEAM IRRADIATION OF AN ION-EXCHANGE RESIN, International journal of mass spectrometry and ion processes, 154(3), 1996, pp. 179-191
PLASMA DESORPTION TIME-OF-FLIGHT MASS-SPECTROMETRIC ELUCIDATION OF THE MECHANISMS OF ADHESION ENHANCEMENT BETWEEN PLASMA-TREATED PEEK-CARBON COMPOSITE AND AN EPOXYAMINE ADHESIVE
Authors: NSOULI B RUMEAU P ALLALI H CHABERT B DEBRE O OLADIPO AA SOULIER JP THOMAS JP
Citation: B. Nsouli et al., PLASMA DESORPTION TIME-OF-FLIGHT MASS-SPECTROMETRIC ELUCIDATION OF THE MECHANISMS OF ADHESION ENHANCEMENT BETWEEN PLASMA-TREATED PEEK-CARBON COMPOSITE AND AN EPOXYAMINE ADHESIVE, Rapid communications in mass spectrometry, 9(15), 1995, pp. 1566-1571
COMPARISON OF SECONDARY-ION EMISSION INDUCED IN SILICON-OXIDE BY MEV AND KEV ION-BOMBARDMENT
Authors: ALLALI H NSOULI B THOMAS JP SZYMCZAK W WITTMAACK K
Citation: H. Allali et al., COMPARISON OF SECONDARY-ION EMISSION INDUCED IN SILICON-OXIDE BY MEV AND KEV ION-BOMBARDMENT, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 90(1-4), 1994, pp. 501-504
SECONDARY-ION EMISSION FROM ULTRA-THIN OXIDE LAYERS BOMBARDED BY ENERGETIC (MEV) HEAVY-IONS - DEPTH OF ORIGIN AND LAYER HOMOGENEITY
Authors: ALLALI H CABAUD B FUCHS G HOAREAU A NSOULI B THOMAS JP TREILLEUX M DANEL JS
Citation: H. Allali et al., SECONDARY-ION EMISSION FROM ULTRA-THIN OXIDE LAYERS BOMBARDED BY ENERGETIC (MEV) HEAVY-IONS - DEPTH OF ORIGIN AND LAYER HOMOGENEITY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 84(3), 1994, pp. 303-309
SECONDARY-EMISSION OF NEGATIVE-IONS AND ELECTRONS RESULTING FROM ELECTRONIC SPUTTERING OF CESIUM SALTS - DIFFERENCES BETWEEN HALIDES AND OXYGENATED SALTS
Authors: ALLALI H NSOULI B THOMAS JP
Citation: H. Allali et al., SECONDARY-EMISSION OF NEGATIVE-IONS AND ELECTRONS RESULTING FROM ELECTRONIC SPUTTERING OF CESIUM SALTS - DIFFERENCES BETWEEN HALIDES AND OXYGENATED SALTS, International journal of mass spectrometry and ion processes, 127, 1993, pp. 111-121
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