Authors:
BUKHARAEV AA
BUKHARAEVA AA
NURGAZIZOV NI
OVCHINNIKOV DV
Citation: Aa. Bukharaev et al., IN-SITU EXAMINATION OF THE CHEMICAL ETCHING OF SIO2-SI STRUCTURES USING AN ATOMIC-FORCE MICROSCOPE, Technical physics letters, 24(11), 1998, pp. 863-865
Authors:
BUKHARAEV AA
OVCHINNIKOV DV
NURGAZIZOV NI
KUKOVITSKII EF
KLAIBER M
WIESENDANGER R
Citation: Aa. Bukharaev et al., INVESTIGATION OF MICROMAGNETISM AND MAGNETIC REVERSAL OF NI NANOPARTICLES USING A MAGNETIC FORCE MICROSCOPE, Physics of the solid state, 40(7), 1998, pp. 1163-1168
Authors:
BUKHARAEV AA
KUKOVITSKII EF
OVCHINNIKOV DV
SAINOV NA
NURGAZIZOV NI
Citation: Aa. Bukharaev et al., SCANNING FORCE MICROSCOPY OF CATALYTIC NICKEL PARTICLES PREPARED FROMCARBON NANOTUBES, Physics of the solid state, 39(11), 1997, pp. 1846-1851