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Authors: BUKHARAEV AA BUKHARAEVA AA NURGAZIZOV NI OVCHINNIKOV DV
Citation: Aa. Bukharaev et al., IN-SITU EXAMINATION OF THE CHEMICAL ETCHING OF SIO2-SI STRUCTURES USING AN ATOMIC-FORCE MICROSCOPE, Technical physics letters, 24(11), 1998, pp. 863-865

Authors: BUKHARAEV AA OVCHINNIKOV DV NURGAZIZOV NI KUKOVITSKII EF KLAIBER M WIESENDANGER R
Citation: Aa. Bukharaev et al., INVESTIGATION OF MICROMAGNETISM AND MAGNETIC REVERSAL OF NI NANOPARTICLES USING A MAGNETIC FORCE MICROSCOPE, Physics of the solid state, 40(7), 1998, pp. 1163-1168

Authors: BUKHARAEV AA KUKOVITSKII EF OVCHINNIKOV DV SAINOV NA NURGAZIZOV NI
Citation: Aa. Bukharaev et al., SCANNING FORCE MICROSCOPY OF CATALYTIC NICKEL PARTICLES PREPARED FROMCARBON NANOTUBES, Physics of the solid state, 39(11), 1997, pp. 1846-1851
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