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Results:
1-8
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Results: 8
Authors:
Schattschneider, P
Nelhiebel, M
Souchay, H
Jouffrey, B
Citation: P. Schattschneider et al., The physical significance of the mixed dynamic form factor, MICRON, 31(4), 2000, pp. 333-345
Authors:
Stoger, M
Nelhiebel, M
Schattschneider, P
Schlosser, V
Breymesser, A
Jouffrey, B
Citation: M. Stoger et al., EELS microanalysis of polycrystalline silicon thin films for solar cells grown at low temperatures, SOL EN MAT, 63(2), 2000, pp. 177-184
Authors:
Nelhiebel, M
Schattschneider, P
Jouffrey, B
Citation: M. Nelhiebel et al., Observation of ionization in a crystal interferometer, PHYS REV L, 85(9), 2000, pp. 1847-1850
Authors:
Nelhiebel, M
Luchier, N
Schorsch, P
Schattschneider, P
Jouffrey, B
Citation: M. Nelhiebel et al., The mixed dynamic form factor for atomic core-level excitations in interferometric electron-energy-loss experiments, PHIL MAG B, 79(6), 1999, pp. 941-953
Authors:
Stoger, M
Breymesser, A
Schlosser, V
Ramadori, M
Plunger, V
Peiro, D
Voz, C
Bertomeu, J
Nelhiebel, M
Schattschneider, P
Andreu, J
Citation: M. Stoger et al., Investigation of defect formation and electronic transport in microcrystalline silicon deposited by hot-wire CVD, PHYSICA B, 274, 1999, pp. 540-543
Authors:
Nelhiebel, M
Louf, PH
Schattschneider, P
Blaha, P
Schwarz, K
Jouffrey, B
Citation: M. Nelhiebel et al., Theory of orientation-sensitive near-edge fine-structure core-level spectroscopy, PHYS REV B, 59(20), 1999, pp. 12807-12814
Authors:
Schattschneider, P
Nelhiebel, M
Jouffrey, B
Citation: P. Schattschneider et al., Density matrix of inelastically scattered fast electrons, PHYS REV B, 59(16), 1999, pp. 10959-10969
Authors:
Souche, C
Jouffrey, B
Nelhiebel, M
Citation: C. Souche et al., Orientation sensitive EELS-analysis of boron nitride nanometric hollow spheres, MICRON, 29(6), 1998, pp. 419-424
Risultati:
1-8
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