Citation: Dl. Kelly et al., Comparison of discharge rates and drug costs for patients with schizophrenia treated with risperidone or olanzapine, PSYCH SERV, 52(5), 2001, pp. 676-678
Authors:
Kolodny, LA
Willard, DM
Carillo, LL
Nelson, MW
Van Orden, A
Citation: La. Kolodny et al., Spatially correlated fluorescence/AFM of individual nanosized particles and biomolecules, ANALYT CHEM, 73(9), 2001, pp. 1959-1966
Authors:
Schroeder, PG
Nelson, MW
Parkinson, BA
Schlaf, R
Citation: Pg. Schroeder et al., Investigation of band bending and charging phenomena in frontier orbital alignment measurements of para-quaterphenyl thin films grown on highly oriented pyrolytic graphite and SnS2, SURF SCI, 459(3), 2000, pp. 349-364
Authors:
Schlaf, R
Schroeder, PG
Nelson, MW
Parkinson, BA
Merritt, CD
Crisafulli, LA
Murata, H
Kafafi, ZH
Citation: R. Schlaf et al., Determination of interface dipole and band bending at the Ag/tris (8-hydroxyquinolinato) gallium organic Schottky contact by ultraviolet photoemission spectroscopy, SURF SCI, 450(1-2), 2000, pp. 142-152
Authors:
Nelson, MW
Schroeder, PG
Schlaf, R
Parkinson, BA
Citation: Mw. Nelson et al., Two-dimensional dopant profiling of an integrated circuit using bias-applied phase-imaging tapping mode atomic force microscopy, EL SOLID ST, 2(9), 1999, pp. 475-477
Authors:
Nelson, MW
Schroeder, PG
Schlaf, R
Parkinson, BA
Citation: Mw. Nelson et al., Two-dimensional dopant profiling of patterned Si wafers using phase imaging tapping mode atomic force microscopy with applied biases, J VAC SCI B, 17(4), 1999, pp. 1354-1360
Authors:
Schlaf, R
Schroeder, PG
Nelson, MW
Parkinson, BA
Lee, PA
Nebesny, KW
Armstrong, NR
Citation: R. Schlaf et al., Observation of strong band bending in perylene tetracarboxylic dianhydridethin films grown on SnS2, J APPL PHYS, 86(3), 1999, pp. 1499-1509
Authors:
Nelson, MW
Schroeder, PG
Schlaf, R
Parkinson, BA
Almgren, CW
Erickson, AN
Citation: Mw. Nelson et al., Spatially resolved dopant profiling of patterned Si wafers by bias-appliedphase-imaging tapping-mode atomic force microscopy, APPL PHYS L, 74(10), 1999, pp. 1421-1423