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Results: 1-11 |
Results: 11

Authors: Kelly, DL Nelson, MW Love, RC Yu, Y Conley, RR
Citation: Dl. Kelly et al., Comparison of discharge rates and drug costs for patients with schizophrenia treated with risperidone or olanzapine, PSYCH SERV, 52(5), 2001, pp. 676-678

Authors: Kelly, DL Nelson, MW Love, RC Yu, Y Conley, RR
Citation: Dl. Kelly et al., Conclusions about risperidone - Reply, PSYCH SERV, 52(11), 2001, pp. 1535-1535

Authors: Nelson, MW Bloomfield, R Hales, JW Libby, R
Citation: Mw. Nelson et al., The effect of information strength and weight on behavior in financial markets, ORGAN BEHAV, 86(2), 2001, pp. 168-196

Authors: Kolodny, LA Willard, DM Carillo, LL Nelson, MW Van Orden, A
Citation: La. Kolodny et al., Spatially correlated fluorescence/AFM of individual nanosized particles and biomolecules, ANALYT CHEM, 73(9), 2001, pp. 1959-1966

Authors: Schroeder, PG Nelson, MW Parkinson, BA Schlaf, R
Citation: Pg. Schroeder et al., Investigation of band bending and charging phenomena in frontier orbital alignment measurements of para-quaterphenyl thin films grown on highly oriented pyrolytic graphite and SnS2, SURF SCI, 459(3), 2000, pp. 349-364

Authors: Schlaf, R Schroeder, PG Nelson, MW Parkinson, BA Merritt, CD Crisafulli, LA Murata, H Kafafi, ZH
Citation: R. Schlaf et al., Determination of interface dipole and band bending at the Ag/tris (8-hydroxyquinolinato) gallium organic Schottky contact by ultraviolet photoemission spectroscopy, SURF SCI, 450(1-2), 2000, pp. 142-152

Authors: Nelson, MW Schroeder, PG Schlaf, R Parkinson, BA
Citation: Mw. Nelson et al., Two-dimensional dopant profiling of an integrated circuit using bias-applied phase-imaging tapping mode atomic force microscopy, EL SOLID ST, 2(9), 1999, pp. 475-477

Authors: Nelson, MW Schroeder, PG Schlaf, R Parkinson, BA
Citation: Mw. Nelson et al., Two-dimensional dopant profiling of patterned Si wafers using phase imaging tapping mode atomic force microscopy with applied biases, J VAC SCI B, 17(4), 1999, pp. 1354-1360

Authors: Bloomfield, R Libby, R Nelson, MW
Citation: R. Bloomfield et al., Confidence and the welfare of less-informed investors, ACC ORG SOC, 24(8), 1999, pp. 623-647

Authors: Schlaf, R Schroeder, PG Nelson, MW Parkinson, BA Lee, PA Nebesny, KW Armstrong, NR
Citation: R. Schlaf et al., Observation of strong band bending in perylene tetracarboxylic dianhydridethin films grown on SnS2, J APPL PHYS, 86(3), 1999, pp. 1499-1509

Authors: Nelson, MW Schroeder, PG Schlaf, R Parkinson, BA Almgren, CW Erickson, AN
Citation: Mw. Nelson et al., Spatially resolved dopant profiling of patterned Si wafers by bias-appliedphase-imaging tapping-mode atomic force microscopy, APPL PHYS L, 74(10), 1999, pp. 1421-1423
Risultati: 1-11 |