Citation: De. Newbury et Db. Williams, The electron microscope: The materials characterization tool of the millennium, ACT MATER, 48(1), 2000, pp. 323-346
Authors:
Newbury, DE
Wollman, DA
Hilton, GC
Irwin, KD
Bergren, NF
Rudman, DA
Martinis, JM
Citation: De. Newbury et al., The approaching revolution in X-ray microanalysis: The microcalorimeter energy dispersive spectrometer, J RAD NUCL, 244(3), 2000, pp. 627-635
Authors:
Wollman, DA
Nam, SW
Newbury, DE
Hilton, GC
Irwin, KD
Bergren, NF
Deiker, S
Rudman, DA
Martinis, JM
Citation: Da. Wollman et al., Superconducting transition-edge-microcalorimeter X-ray spectrometer with 2eV energy resolution at 1.5 keV, NUCL INST A, 444(1-2), 2000, pp. 145-150
Authors:
Wollman, DA
Nam, SW
Hilton, GC
Irwin, KD
Bergren, NF
Rudman, DA
Martinis, JM
Newbury, DE
Citation: Da. Wollman et al., Microcalorimeter energy-dispersive spectrometry using a low voltage scanning electron microscope, J MICROSC O, 199, 2000, pp. 37-44
Citation: De. Newbury et Ds. Bright, Logarithmic 3-band color encoding: Robust method for display and comparison of compositional maps in electron probe X-ray microanalysis, MICROS MICR, 5(5), 1999, pp. 333-343
Citation: De. Newbury, Standardless quantitative electron-excited X-ray microanalysis by energy-dispersive spectrometry: What is its proper role?, MICROS MICR, 4(6), 1998, pp. 585-597