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Results:
1-8
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Results: 8
Authors:
Vergos, HT
Tsiatouhas, Y
Haniotakis, T
Nikolos, D
Nicolaidis, M
Citation: Ht. Vergos et al., Path delay fault testing of multiplexer-based shifters, INT J ELECT, 88(8), 2001, pp. 923-937
Authors:
Nicolaidis, M
Roy, R
Citation: M. Nicolaidis et R. Roy, Guest editorial, J ELEC TEST, 15(1-2), 1999, pp. 9-9
Authors:
Jarron, P
Anelli, G
Calin, T
Cosculluela, J
Campbell, B
Delmastro, M
Faccio, F
Giraldo, A
Heijne, E
Kloukinas, K
Letheren, M
Nicolaidis, M
Moreira, P
Paccagnella, A
Marchioro, A
Snoeys, W
Velazco, R
Citation: P. Jarron et al., Deep submicron CMOS technologies for the LHC experiments, NUCL PH B-P, 78, 1999, pp. 625-634
Authors:
Nicolaidis, M
Duarte, RO
Citation: M. Nicolaidis et Ro. Duarte, Fault-secure parity prediction booth multipliers, IEEE DES T, 16(3), 1999, pp. 90-101
Authors:
Hawkins, CF
Baker, K
Butler, K
Figueras, J
Nicolaidis, M
Rao, V
Roy, R
Welsher, T
Citation: Cf. Hawkins et al., Roundtable: IC reliability and test: What will deep submicron bring?, IEEE DES T, 16(2), 1999, pp. 84-91
Authors:
Levendel, I
Nicolaidis, M
Abraham, JA
Abramovici, M
Motto, S
Citation: I. Levendel et al., A D&T roundtable - Online test, IEEE DES T, 16(1), 1999, pp. 80-86
Authors:
Faccio, F
Kloukinas, K
Marchioro, A
Calin, T
Cosculluela, J
Nicolaidis, M
Velazco, R
Citation: F. Faccio et al., Single event effects in static and dynamic registers in a 0.25 mu m CMOS technology, IEEE NUCL S, 46(6), 1999, pp. 1434-1439
Authors:
Nicolaidis, M
Citation: M. Nicolaidis, On-line testing for VLSI: state of the art and trends, INTEGRATION, 26(1-2), 1998, pp. 197-209
Risultati:
1-8
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