Authors: Nie, HY McIntyre, NS

Citation: Hy. Nie et Ns. Mcintyre, A simple and effective method of evaluating atomic force microscopy tip performance, LANGMUIR, 17(2), 2001, pp. 432-436

Authors: Nie, HY Walzak, MJ McIntyre, NS

Citation: Hy. Nie et al., Draw-ratio-dependent morphology of biaxially oriented polypropylene films as determined by atomic force microscopy, POLYMER, 41(6), 2000, pp. 2213-2218

Authors: Nie, HY

Citation: Hy. Nie, Formation and decomposition of hydrogen-related electron traps at hydrogenated Pd/GaAs (n-type) Schottky interfaces, J APPL PHYS, 87(9), 2000, pp. 4327-4331

Authors: Nie, HY Walzak, MJ Berno, B McIntyre, NS

Citation: Hy. Nie et al., Microscopic stripe formation and adhesion force increase introduced by local shear-stress deformation of polypropylene film, LANGMUIR, 15(19), 1999, pp. 6484-6489

Authors: Nie, HY Walzak, MJ Berno, B McIntyre, NS

Citation: Hy. Nie et al., Atomic force microscopy study of polypropylene surfaces treated by UV and ozone exposure: modification of morphology and adhesion force, APPL SURF S, 145, 1999, pp. 627-632

Authors: Nie, HY Walzak, MJ McIntyre, NS El-Sherik, AM

Citation: Hy. Nie et al., Application of lateral force imaging to enhance topographic features of polypropylene film and photo-cured polymers, APPL SURF S, 145, 1999, pp. 633-637