Authors: Berger, D Filippov, M Niedrig, H Rau, EI Schlichting, F

Citation: D. Berger et al., Experimental determination of energy resolution and transmission characteristics of an electrostatic toroidal spectrometer adapted to a standard scanning electron microscope, J ELEC SPEC, 105(2-3), 1999, pp. 119-127

Authors: Berger, D Niedrig, H

Citation: D. Berger et H. Niedrig, Complete angular distribution of electrons backscattered from tilted multicomponent specimens, SCANNING, 21(3), 1999, pp. 187-190

Authors: Schlichting, F Berger, D Niedrig, H

Citation: F. Schlichting et al., Thickness determination of ultra-thin films using backscattered electron spectra of a new toroidal electrostatic spectrometer, SCANNING, 21(3), 1999, pp. 197-203

Authors: Niedrig, H

Citation: H. Niedrig, Matter waves, electron optics, OPTICS OF WAVES AND PARTICLES, 1999, pp. 961-1042