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Results:
1-8
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Results: 8
Authors:
Monaghan, ML
Nigam, T
Houssa, M
De Gendt, S
Urbach, HP
de Bokx, PK
Citation: Ml. Monaghan et al., Characterization of silicon oxynitride films by grazing-emission X-ray fluorescence spectrometry, THIN SOL FI, 359(2), 2000, pp. 197-202
Authors:
Crupi, F
Degraeve, R
Groeseneken, G
Nigam, T
Maes, H
Citation: F. Crupi et al., Investigation and comparison of the noise in the gate and substrate current after soft-breakdown, JPN J A P 1, 38(4B), 1999, pp. 2219-2222
Authors:
Nigam, T
Citation: T. Nigam, Brief therapy and network intervention - an integrated approach, J PSYCH NEU, 24(1), 1999, pp. 56-57
Authors:
Cameron, PM
Leszcz, M
Bebchuk, W
Swinson, RP
Antony, MM
Azim, HF
Doidge, N
Korenblum, MS
Nigam, T
Perry, JC
Seeman, MV
Citation: Pm. Cameron et al., The practice and roles of the psychotherapies: A discussion paper, CAN J PSY, 44, 1999, pp. 18S-31S
Authors:
Groeseneken, G
Degraeve, R
Nigam, T
Van den Bosch, G
Maes, HE
Citation: G. Groeseneken et al., Hot carrier degradation and time-dependent dielectric breakdown in oxides, MICROEL ENG, 49(1-2), 1999, pp. 27-40
Authors:
Kaczer, B
Degraeve, R
Pangon, N
Nigam, T
Groeseneken, G
Citation: B. Kaczer et al., Investigation of temperature acceleration of thin oxide time-to-breakdown, MICROEL ENG, 48(1-4), 1999, pp. 47-50
Authors:
Houssa, M
Nigam, T
Mertens, PW
Heyns, MM
Citation: M. Houssa et al., Effect of extreme surface roughness on the electrical characteristics of ultra-thin gate oxides, SOL ST ELEC, 43(1), 1999, pp. 159-167
Authors:
Heyns, MM
Bearda, T
Cornelissen, I
De Gendt, S
Degraeve, R
Groeseneken, G
Kenens, C
Knotter, DM
Loewenstein, LM
Mertens, PW
Mertens, S
Meuris, M
Nigam, T
Schaekers, M
Teerlinck, I
Vandervorst, W
Vos, R
Wolke, K
Citation: Mm. Heyns et al., Cost-effective cleaning and high-quality thin gate oxides, IBM J RES, 43(3), 1999, pp. 339-350
Risultati:
1-8
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