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Results: 1-25/34
Authors:
Jonsson, AK
Frenning, G
Nilsson, M
Mattsson, MS
Niklasson, GA
Citation: Ak. Jonsson et al., Dielectric study of thin films of Ta2O5 and ZrO2, IEEE DIELEC, 8(4), 2001, pp. 648-651
Authors:
Vargas, WE
Niklasson, GA
Citation: We. Vargas et Ga. Niklasson, Optical properties of nano-structured dye-sensitized solar cells, SOL EN MAT, 69(2), 2001, pp. 147-163
Authors:
Hedenus, P
Mattsson, MS
Niklasson, GA
Camber, O
Ek, R
Citation: P. Hedenus et al., Characterisation of instantaneous water absorption properties of pharmaceutical excipients (vol 202, pg 141, 2000), INT J PHARM, 224(1-2), 2001, pp. 207-207
Authors:
Hultaker, A
Jarrendahl, K
Lu, J
Granqvist, CG
Niklasson, GA
Citation: A. Hultaker et al., Electrical and optical properties of sputter deposited tin doped indium oxide thin films with silver additive, THIN SOL FI, 392(2), 2001, pp. 305-310
Authors:
Karmhag, R
Tesfamichael, T
Niklasson, GA
Wackelgard, E
Nygren, M
Citation: R. Karmhag et al., Oxidation kinetics of nickel solar absorber nanoparticles, J PHYS D, 34(3), 2001, pp. 400-406
Authors:
Rodriguez, J
Gomez, M
Niklasson, GA
Lindquist, SE
Granqvist, CG
Citation: J. Rodriguez et al., Sputter-deposited Ti oxide films used for photoelectrocatalytic degradation of 4-chlorophenol, J MATER SCI, 36(15), 2001, pp. 3699-3705
Authors:
Stromme, M
Niklasson, GA
Ritala, M
Leskela, M
Kukli, K
Citation: M. Stromme et al., (Ta1-xNbx)(2)O-5 films produced by atomic layer deposition: Temperature dependent dielectric spectroscopy and room-temperature I-V characteristics, J APPL PHYS, 90(9), 2001, pp. 4532-4542
Authors:
Berggren, L
Azens, A
Niklasson, GA
Citation: L. Berggren et al., Polaron absorption in amorphous tungsten oxide films, J APPL PHYS, 90(4), 2001, pp. 1860-1863
Authors:
Pustovit, VN
Niklasson, GA
Citation: Vn. Pustovit et Ga. Niklasson, Observability of resonance optical structure in fractal metallic clusters, J APPL PHYS, 90(3), 2001, pp. 1275-1279
Authors:
Karmhag, R
Niklasson, GA
Nygren, M
Citation: R. Karmhag et al., Oxidation kinetics of nickel nanoparticles, J APPL PHYS, 89(5), 2001, pp. 3012-3017
Authors:
Niklasson, GA
Klasson, J
Olsson, E
Citation: Ga. Niklasson et al., Polaron absorption in tungsten oxide nanoparticle aggregates, ELECTR ACT, 46(13-14), 2001, pp. 1967-1971
Authors:
Frenning, G
Nilsson, M
Westlinder, J
Niklasson, GA
Mattsson, MS
Citation: G. Frenning et al., Dielectric and Li transport properties of electron conducting and non-conducting sputtered amorphous Ta2O5 films, ELECTR ACT, 46(13-14), 2001, pp. 2041-2046
Authors:
Frenning, G
Engelmark, F
Niklasson, GA
Stromme, M
Citation: G. Frenning et al., Li conduction in sputtered amorphous Ta2O5, J ELCHEM SO, 148(5), 2001, pp. A418-A421
Authors:
Tesfamichael, T
Hoel, A
Niklasson, GA
Wackelgard, E
Gunde, MK
Orel, ZC
Citation: T. Tesfamichael et al., Optical characterization method for black pigments applied to solar-selective absorbing paints, APPL OPTICS, 40(10), 2001, pp. 1672-1681
Authors:
Vargas, WE
Niklasson, GA
Citation: We. Vargas et Ga. Niklasson, Reflectance of pigmented polymer coatings: comparisons between measurements and radiative transfer calculations, APPL OPTICS, 40(1), 2001, pp. 85-94
Authors:
Jonsson, AK
Mattsson, MS
Niklasson, GA
Citation: Ak. Jonsson et al., Li intercalation in zirconium dioxide films, DEFECT DIFF, 177-1, 2000, pp. 51-58
Authors:
Hedenus, P
Mattsson, MS
Niklasson, GA
Camber, O
Ek, R
Citation: P. Hedenus et al., Characterisation of instantaneous water absorption properties of pharmaceutical excipients, INT J PHARM, 202(1-2), 2000, pp. 141-149
Authors:
Mattsson, MS
Hedenus, P
Niklasson, GA
Ek, R
Citation: Ms. Mattsson et al., A new method of characterising liquid uptake within particles over short time periods, INT J PHARM, 199(2), 2000, pp. 179-185
Authors:
Brogren, M
Harding, GL
Karmhag, R
Ribbing, CG
Niklasson, GA
Stenmark, L
Citation: M. Brogren et al., Titanium-aluminum-nitride coatings for satellite temperature control, THIN SOL FI, 370(1-2), 2000, pp. 268-277
Authors:
Rodriguez, J
Gomez, M
Ederth, J
Niklasson, GA
Granqvist, CG
Citation: J. Rodriguez et al., Thickness dependence of the optical properties of sputter deposited Ti oxide films, THIN SOL FI, 365(1), 2000, pp. 119-125
Authors:
Niklasson, GA
Ronnow, D
Mattsson, MS
Kullman, L
Nilsson, H
Roos, A
Citation: Ga. Niklasson et al., Surface roughness of pyrolytic tin dioxide films evaluated by different methods, THIN SOL FI, 359(2), 2000, pp. 203-209
Authors:
Tesfamichael, T
Hoel, A
Wackelgard, E
Niklasson, GA
Gunde, MK
Orel, ZC
Citation: T. Tesfamichael et al., Optical characterization and modeling of black pigments used in thickness-sensitive solar-selective absorbing paints, SOLAR ENERG, 69(1-6), 2000, pp. 35-43
Authors:
Vargas, WE
Greenwood, P
Otterstedt, JE
Niklasson, GA
Citation: We. Vargas et al., Light scattering in pigmented coatings: Experiments and theory, SOLAR ENERG, 68(6), 2000, pp. 553-561
Authors:
Rodriguez, J
Gomez, M
Niklasson, GA
Granqvist, CG
Citation: J. Rodriguez et al., Alternating current characterization of sputter deposited Ti oxide films, J PHYS D, 33(1), 2000, pp. 24-27
Authors:
Lindstrom, T
Isidorsson, J
Niklasson, GA
Citation: T. Lindstrom et al., Surface roughness in sputtered SnO2 films studied by atomic force microscopy and spectroscopic light scattering, J APPL PHYS, 87(9), 2000, pp. 4562-4571