Authors: Liu, S Ning, YG Zhang, Y Zhang, HW Ai, C Liu, JG Yang, JD Li, K

Citation: S. Liu et al., Study on a method of the thickness measurement of ultra-thin PtSi film, ACT PHY C E, 50(8), 2001, pp. 1447-1450

Authors: Xie, D Jiang, YD Ning, YG Jiang, JZ Wu, ZM Li, YY

Citation: D. Xie et al., Study on the characteristics and relative properties of Langmuir-Blodgett films based on substituted bis[phthalocyaninato] rare earth(III) complexes, MATER LETT, 51(1), 2001, pp. 1-6