Authors:
Wakahara, Y
Nitta, F
Utsunomiya, E
Oda, T
Saito, H
Citation: Y. Wakahara et al., Fast protocol validation by the combination of process inspection and global inspection, ELEC C JP 1, 83(7), 2000, pp. 26-39
Authors:
Miyawaki, Y
Ishizaki, O
Okihara, Y
Inaba, T
Nitta, F
Mihara, M
Hayasaka, T
Kobayashi, K
Omae, T
Kimura, H
Shimizu, S
Makimoto, H
Kawajiri, Y
Wada, M
Sonoyama, K
Etoh, J
Citation: Y. Miyawaki et al., A 29-mm(2), 1.8-V-only, 16-Mb DINOR flash memory with gate-protected-poly-diode (GPPD) charge pump, IEEE J SOLI, 34(11), 1999, pp. 1551-1556