Authors: Gogineni, U Cressler, JD Niu, G Harame, DL

Citation: U. Gogineni et al., Hot electron and hot hole degradation of UHV/CVD SiGeHBT's, IEEE DEVICE, 47(7), 2000, pp. 1440-1448

Authors: Niu, G Cressler, JD

Citation: G. Niu et Jd. Cressler, The impact of bandgap offset distribution between conduction and valence bands in Si-based graded bandgap HBT's, SOL ST ELEC, 43(12), 1999, pp. 2225-2230

Authors: Banerjee, G Niu, G Cressler, JD Clark, SD Palmer, MJ Ahlgren, DC

Citation: G. Banerjee et al., Anomalous dose rate effects in gamma irradiated SiGe heterojunction bipolar transistors, IEEE NUCL S, 46(6), 1999, pp. 1620-1626

Authors: Niu, G Mathew, SJ Banerjee, G Cressler, JD Clark, SD Palmer, MJ Subbanna, S

Citation: G. Niu et al., Total dose effects on the shallow-trench isolation leakage current characteristics in a 0.35 mu m SiGeBiCMOS technology, IEEE NUCL S, 46(6), 1999, pp. 1841-1847

Authors: Mathew, SJ Niu, G Clark, SD Cressler, JD Palmer, MJ Dubbelday, WB

Citation: Sj. Mathew et al., Radiation-induced back-channel leakage in SiGeCMOS on silicon-on-sapphire (SOS) technology, IEEE NUCL S, 46(6), 1999, pp. 1848-1853

Authors: Nguyen, QT Kozai, T Niu, G Nguyen, UV

Citation: Qt. Nguyen et al., Photosynthetic characteristics of coffee (Coffea arabusta) plantlets in vitro in response to different CO2 concentrations and light intensities, PL CELL TIS, 55(2), 1998, pp. 133-139