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Results: 1-5 |
Results: 5

Authors: Nurgazizov, NI Bukharaev, AA Sugonyako, AV Zhykharev, VA
Citation: Ni. Nurgazizov et al., AFM investigation of radiation damage distribution in implanted silicon oxide, PHYS LOW-D, 3-4, 2001, pp. 97-102

Authors: Bukharaev, AA Nurgazizov, NI Mozhanova, AA Ovchinnikov, DV
Citation: Aa. Bukharaev et al., AFM investigation of selective etching mechanism of nanostructured silica, SURF SCI, 482, 2001, pp. 1319-1324

Authors: Bukharaev, AA Nurgazizov, NI Ovchinnikov, DV Mozhanova, AA
Citation: Aa. Bukharaev et al., In situ investigation of chemical etching of implanted silicon dioxide in aqueous solutions by atomic-force microscopy, RUS J AP CH, 73(8), 2000, pp. 1332-1337

Authors: Klochkov, AV Naletov, VV Tagirov, MS Tayurskii, DA Yudin, AN Zhdanov, RS Zhdanov, MR Bukharaev, AA Nurgazizov, NI
Citation: Av. Klochkov et al., NMR and AFM investigations of nanocavities on the double rare-earth fluoride crystal surface, APPL MAGN R, 19(2), 2000, pp. 197-208

Authors: Stepanov, AL Hole, DE Bukharaev, AA Townsend, PD Nurgazizov, NI
Citation: Al. Stepanov et al., Reduction of the size of the implanted silver nanoparticles in float glassduring excimer laser annealing, APPL SURF S, 136(4), 1998, pp. 298-305
Risultati: 1-5 |