Authors: VYVENKO OF DAVYDOV IA ODRINSKII AP TEPLITSKII VA

Citation: Of. Vyvenko et al., PHOTOELECTRIC DEEP-LEVEL RELAXATION SPECTROSCOPY IN CDS SINGLE-CRYSTALS WITH DEVIATIONS FROM STOICHIOMETRY IMPOSED DURING THE GROWTH-PROCESS, Semiconductors, 28(5), 1994, pp. 425-429