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OERTEL G
REINSPERGER GU
SELLE B
SIEBER I
TROPPENZ U
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Authors:
FENSKE F
LANGE H
OERTEL G
REINSPERGER GU
SCHUMANN J
SELLE B
Citation: F. Fenske et al., CHARACTERIZATION OF SEMICONDUCTING SILICIDE FILMS BY INFRARED VIBRATIONAL SPECTROSCOPY, Materials chemistry and physics, 43(3), 1996, pp. 238-242
Authors:
LANGE H
HENRION W
SELLE B
REINSPERGER GU
OERTEL G
VONKANEL H
Citation: H. Lange et al., OPTICAL-PROPERTIES OF BETA-FESI2 FILMS GROWN ON SI SUBSTRATES WITH DIFFERENT DEGREE OF STRUCTURAL PERFECTION, Applied surface science, 102, 1996, pp. 169-172
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Citation: A. Yin et G. Oertel, KINEMATICS AND STRAIN DISTRIBUTION OF A THRUST-RELATED FOLD SYSTEM INTHE LEWIS THRUST PLATE, NORTHWESTERN MONTANA (USA), Journal of structural geology, 15(6), 1993, pp. 707-719