Citation: Kr. Olasupo et Mk. Hatalis, LEAKAGE CURRENT MECHANISM IN SUBMICRON POLYSILICON THIN-FILM TRANSISTORS, I.E.E.E. transactions on electron devices, 43(8), 1996, pp. 1218-1223
Citation: Kr. Olasupo et al., THE EFFECT OF DRAIN OFFSET ON CURRENT-VOLTAGE CHARACTERISTICS IN SUB MICRON POLYSILICON THIN-FILM TRANSISTORS, I.E.E.E. transactions on electron devices, 43(8), 1996, pp. 1306-1308