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RELATION BETWEEN YIELD AND RELIABILITY OF INTEGRATED-CIRCUITS AND APPLICATION TO FAILURE RATE ASSESSMENT AND REDUCTION IN THE ONE DIGIT FITAND PPM RELIABILITY ERA
Authors: VANDERPOL JA KUPER FG OOMS ER
Citation: Ja. Vanderpol et al., RELATION BETWEEN YIELD AND RELIABILITY OF INTEGRATED-CIRCUITS AND APPLICATION TO FAILURE RATE ASSESSMENT AND REDUCTION IN THE ONE DIGIT FITAND PPM RELIABILITY ERA, Microelectronics and reliability, 36(11-12), 1996, pp. 1603-1610
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