Citation: A. Jakubowicz et A. Oosenbrug, SEM EBIC CHARACTERIZATION OF DEGRADATION AT MIRRORS OF GAAS ALGAAS LASER-DIODES/, Microelectronic engineering, 24(1-4), 1994, pp. 189-194
Citation: A. Jakubowicz et al., LASER OPERATION-INDUCED MIGRATION OF BERYLLIUM AT MIRRORS OF GAAS ALGAAS LASER-DIODES/, Applied physics letters, 63(9), 1993, pp. 1185-1187