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Results:
1-9
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Results: 9
Authors:
OPILSKI A
ROGOZINSKI R
BLAHUT M
KARASINSKI P
GUT K
OPILSKI Z
Citation: A. Opilski et al., TECHNOLOGY OF ION-EXCHANGE IN GLASS AND ITS APPLICATION IN WAVE-GUIDEPLANAR SENSORS, Optical engineering, 36(6), 1997, pp. 1625-1638
Authors:
URBANCZYK M
JAKUBIK W
OPILSKI A
Citation: M. Urbanczyk et al., SAW SENSOR FOR NO2, Acustica, 82, 1996, pp. 181-181
Authors:
ROGOZINSKI R
OPILSKI A
Citation: R. Rogozinski et A. Opilski, DEFINING REFRACTIVE DIFFUSIVE PROFILES OF PLANAR STRUCTURES IN GLASSES BY MEANS OF A FRINGE PATTERN FIELD, Optica Applicata, 26(2), 1996, pp. 71-80
Authors:
SZUBER J
SZCZEPANIAK B
KOCHOWSKI S
OPILSKI A
Citation: J. Szuber et al., ELECTRONIC-PROPERTIES OF THE IRON PHTHALOCYANINE THIN-FILMS UHV ANNEALED AND EXPOSED TO OXYGEN, Vacuum, 46(5-6), 1995, pp. 547-549
Authors:
SZUBER J
SZCZEPANIAK B
KOCHOWSKI S
OPILSKI A
Citation: J. Szuber et al., PHOTOEMISSION YIELD SPECTROSCOPY INVESTIGATIONS OF THE ELECTRONIC-PROPERTIES OF COPPER PHTHALOCYANINE THIN-FILMS UHV ANNEALED AND EXPOSED TO OXYGEN, Physica status solidi. b, Basic research, 183(1), 1994, pp. 110000009-110000013
Authors:
KARASINSKI P
GUT K
BLAHUT M
OPILSKI A
Citation: P. Karasinski et al., MULTIMODE PLANAR REFRACTOMETER PRODUCED IN A WAVED CHANNEL LIGHTGUIDESTRUCTURE, Optica Applicata, 24(3), 1994, pp. 163-170
Authors:
BLAHUT M
ROGOZINSKI M
GUT K
KARASINSKI P
OPILSKI A
Citation: M. Blahut et al., MODEL OF PLANAR REFRACTOMETER BASED ON A 2-PORT INTERFEROMETER IN GLASS, Optica Applicata, 24(3), 1994, pp. 171-177
Authors:
SZUBER J
SZCZEPANIAK B
PIWOWARCZYK M
KOCHOWSKI S
OPILSKI A
Citation: J. Szuber et al., ELECTRONIC-PROPERTIES OF THE SPACE-CHARGE LAYER OF THE COPPER PHTHALOCYANINE THIN-FILMS, Czechoslovak journal of Physics, 43(9-10), 1993, pp. 1041-1044
Authors:
MALECKI I
WITOS F
OPILSKI A
Citation: I. Malecki et al., ACOUSTIC-EMISSION SOURCE PARAMETERS IN COAL SAMPLES, Acustica, 79(2), 1993, pp. 112-116
Risultati:
1-9
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