Authors:
CHEN L
KANG CS
ORALKAN O
DUMIN DJ
BROWN GA
BELLUTTI P
Citation: L. Chen et al., THE SEARCH FOR CATHODE AND ANODE TRAPS IN HIGH-VOLTAGE STRESSED SILICON-OXIDES, Journal of the Electrochemical Society, 145(4), 1998, pp. 1292-1296
Authors:
JACKSON JC
ROBINSON T
ORALKAN O
DUMIN DJ
BROWN GA
Citation: Jc. Jackson et al., DIFFERENTIATION BETWEEN ELECTRIC BREAKDOWNS AND DIELECTRIC-BREAKDOWN IN THIN SILICON-OXIDES, Journal of the Electrochemical Society, 145(3), 1998, pp. 1033-1038