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Citation: Jc. Jackson et al., DIFFERENTIATION BETWEEN ELECTRIC BREAKDOWNS AND DIELECTRIC-BREAKDOWN IN THIN SILICON-OXIDES, Journal of the Electrochemical Society, 145(3), 1998, pp. 1033-1038

Authors: JACKSON JC ROBINSON T ORALKAN O DUMIN DJ BROWN GA

Citation: Jc. Jackson et al., NONUNIQUENESS OF TIME-DEPENDENT-DIELECTRIC-BREAKDOWN DISTRIBUTIONS, Applied physics letters, 71(25), 1997, pp. 3682-3684